[PDF.20gq] Growth and Characterization of Al(1-x)In(x)N Films andNanostructures: Nitrides, Epitaxy, Selfassembly and Optoelectronics

Growth and Characterization of Al(1-x)In(x)N Films andNanostructures: Nitrides, Epitaxy, Selfassembly and Optoelectronics

[PDF.pj93] Growth and Characterization of Al(1-x)In(x)N Films andNanostructures: Nitrides, Epitaxy, Selfassembly and Optoelectronics

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 |  Yuriy Danylyuk |  2008-09-10 | Original language:English | PDF # 1 |  8.66 x.28 x5.90l,.42 | File type: PDF | 124 pages

 | Growth and Characterization of Al 1 x in x n Films and Nanostructures Nitrides Epitaxy Selfassembly and Optoelectronics

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||About the Author|Assistant Professor (research) of Electrical and ComputerEngineering (SSIM) at Wayne State University. He obtained his Ph.D. from the WSU in Detroit,USA. He is the author and co-author of over 60 scientific papers. His research interestlink betw

The book contains experimental information ofpseudo-epitaxial growth a series of Al(1-x)In(x)N films with thicknesses ranging from 100 nm to 8000 nmand In concentration (x) ranging from 0 to 1 ondifferent substrates (Si, Sapphire, SiC glass) usingPlasma Source Molecular Beam Epitaxy (PSMBE)techniques. Using different growth modes as thespecific film morphology, the self-assemblednanostructures were created. The mechanism of carrierconfinement in these structures are desc...

You can specify the type of files you want, for your device.Growth and Characterization of Al(1-x)In(x)N Films andNanostructures: Nitrides, Epitaxy, Selfassembly and Optoelectronics   |  Yuriy Danylyuk. I was recommended this book by a dear friend of mine.

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