[PDF.64wy] Reliability and Degradation of III-V Optical Devices (Artech House Optoelectronics Library)

Reliability and Degradation of III-V Optical Devices (Artech House Optoelectronics Library)

[PDF.le77] Reliability and Degradation of III-V Optical Devices (Artech House Optoelectronics Library)

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 | #6623246 in Books |  Artech House Publishers |  1996-09-30 | Original language:English | PDF # 1 |  9.21 x.88 x6.14l,1.43 | File type: PDF | 372 pages

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||About the Author|Osamu Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. He earned his Ph.D. in physical engineering from the University of Tokyo. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Phy

Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.

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